Biometric authentication firm Hoyos Labs plans to partner with the National Institute of Standards and Technology (NIST) to develop new methodologies for measuring the image fidelity of contactless fingerprint capture devices.The partnership aims to support evaluation of these devices for future inclusion on the U.S. government's Certified Product Lists.In a statement, Hoyos noted that the disadvantages to the fingerprint on glass process include added time – particularly when capturing rolled prints – as well as hygienic concerns. This is why law enforcement officials are now exploring contactless fingerprint readers as a more effective and efficient alternative.For example, NIST – under sponsorship of the Federal Bureau of Investigation's (FBI) Biometric Center of Excellence – initiated its Contactless Fingerprint Capture Device Measurement Research Program.The NIST program requires direct interaction with emerging technologies to address the following industry challenges: data format standards and best practices, development of methods for certification testing, as well as interoperability assessment with legacy contact-based devices.Through a Cooperative Research and Development Agreement (CRADA) with NIST, Hoyos Labs has offered up the company's touchless mobile biometric application, called 4F, for blind pilot testing. Hoyos Labs joins NIST's other CRADA partners, including 3M Company and MorphoTrack, in contributing its touchless fingerprint acquisition technology to ensure the performance metrics emerging from the collaboration will be suitable for a broad range of devices.Hoyos Labs will be exhibiting at connect:ID 2016, 14-16 March, Washington DC. connect:ID is an international conference and exhibition that focuses on all aspects of identity technologies and the opportunities for their management in both the physical and digital worlds. http://www.connectidexpo.com
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